Sebastian, Anju; Davis, Denet; Simon, Sikha K; Chakyar, Sreedevi P; Jose, Jovia; Kizhakooden, Joe; Paul, Nees; Bindu, C; Joseph, VP; Andrews, Jolly
(American Institute of Physics Inc., 2019-10-29)
This paper describes an efficient method for the precise measurement of thickness of dielectric films using metamaterial Broadside Coupled Split Ring Resonator (BCSRR). The experimental arrangement is based on the frequency ...