dc.contributor.author |
Sebastian, Nicy |
|
dc.contributor.author |
Joseph, Jeena |
|
dc.contributor.author |
Princy, T. |
|
dc.date.accessioned |
2025-01-18T09:27:43Z |
|
dc.date.available |
2025-01-18T09:27:43Z |
|
dc.date.issued |
2022-09 |
|
dc.identifier.citation |
ResearchGate Volume 17 No 3 |
en_US |
dc.identifier.uri |
10.24412/1932-2321-2022-369-361-375 Authors: |
|
dc.identifier.uri |
http://starc.stthomas.ac.in:8080/xmlui/xmlui/handle/123456789/394 |
|
dc.description.abstract |
The main purpose of this paper is to discuss a new lifetime distribution, called the type 1 Topp-Leone
generated q-exponential distribution(Type 1 TLqE). Using the quantile approach various distributional
properties, L−moments, order statistics, and reliability properties were established. We suggested a new
reliability test plan, which is more advantageous and helps in making optimal decisions when the lifetimes
follow this distribution. The new test plan is applied to illustrate its use in industrial contexts. Finally,
we proved empirically the importance and the flexibility of the new model in model building by using a
real data set. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
ResearchGate |
en_US |
dc.subject |
Type 1 Topp-Leone generated q-exponential distribution |
en_US |
dc.subject |
Quantile density function |
en_US |
dc.subject |
Quantile function |
en_US |
dc.subject |
Hazard quantile function |
en_US |
dc.subject |
L−moments |
en_US |
dc.subject |
Reliability Test Plan |
en_US |
dc.title |
Type 1 Topp-Leone q−Exponential Distribution and its Applications |
en_US |
dc.type |
Article |
en_US |